Analytical Method for Critical Human Factors in the Event of Runway Overrun and Veer Off

Lu LIU , Ling CHEN , Xiao-bo ZHU , Lei YANG , Yi-xuan SUN

Science Technology and Engineering ›› 2025, Vol. 25 ›› Issue (22) : 9640 -9648.

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Science Technology and Engineering ›› 2025, Vol. 25 ›› Issue (22) : 9640-9648 DOI: 10.12404/j.issn.1671-1815.2409517
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Analytical Method for Critical Human Factors in the Event of Runway Overrun and Veer Off
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Abstract

A critical human factors analysis method for aircraft runway overrun and veer-off event was proposed to address the complex causal relationship of human factors that have not been fully revealed in the investigation of the event. Firstly, improve the human factors analysis and classification system model to identify the root cause of overrun and excursion event, and use the fault tree analysis method to identify the direct cause of runway overrun and veer-off event. Secondly, a human factors investigation decision support model was constructed, and obtained the causal chain of aircraft runway overrun and veer-off event. Then, a Bayesian network was constructed to quantify the importance of the causal factors for the runway overrun and veer-off event caused by human factors. Through predictive reasoning, diagnostic reasoning, and sensitivity analysis, the key causal chain of the runway overrun and veer-off event was obtained. The results indicate that 32 causal chains of overrun and veer-off events is obtained based on the proposed human factors investigation decision support model, comprehensively revealing the human factors and their coupling relationships of the event. Bayesian inference can obtain the key causal chain of "improper action execution/improper information preprocessing → unsafe behavior → runway overrun and veer-off". The above conclusions are basically consistent with the findings of investigations into aircraft runway overrun and veer-off events, and they hold positive significance for improving the early warning and prevention capabilities of such incidents.

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aviation safety / runway overrun and veer-off / human factor / bayesian networks / cause chain analysis

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Lu LIU, Ling CHEN, Xiao-bo ZHU, Lei YANG, Yi-xuan SUN. Analytical Method for Critical Human Factors in the Event of Runway Overrun and Veer Off. Science Technology and Engineering, 2025, 25(22): 9640-9648 DOI:10.12404/j.issn.1671-1815.2409517

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