An Automatic Unit Test Case Generation Scheme for MC/DC Coverage

Chang QIN , Sai CHEN , Kun LI , Heng LIU , Liu YANG , Zheng MA

Science Technology and Engineering ›› 2024, Vol. 24 ›› Issue (30) : 13039 -13047.

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Science Technology and Engineering ›› 2024, Vol. 24 ›› Issue (30) : 13039-13047 DOI: 10.12404/j.issn.1671-1815.2307618
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An Automatic Unit Test Case Generation Scheme for MC/DC Coverage
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Abstract

In the fields of aerospace, medicine, transportation, and others where strict safety is paramount, MC/DC (modified condition/decision coverage) was commonly utilized instead of traditional coverage criteria in software testing. As a result, a greater number of high-quality test cases are necessary. Due to the aforementioned considerations, a white-box unit test case automatic generation scheme for MC/DC coverage was proposed. Based on the theoretical foundation of mapping from MC/DC coverage to branch coverage, the proposed scheme has developed several tools based on the framework of the symbolic execution engine KLEE and the LLVM(low-level virtual machine). With this approach, automated test cases can be generated that attain the highest possible MC/DC coverage, thereby assisting human testers in identifying potential code defects which prevent the achievement of 100% MC/DC coverage.

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white-box testing / automatic test case generation / modified condition decision overlay / unit test

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Chang QIN, Sai CHEN, Kun LI, Heng LIU, Liu YANG, Zheng MA. An Automatic Unit Test Case Generation Scheme for MC/DC Coverage. Science Technology and Engineering, 2024, 24(30): 13039-13047 DOI:10.12404/j.issn.1671-1815.2307618

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