In order to grasp the risk degree of electrostatic hazard under different process temperature conditions in the production process of explosives, using the Langley-Optimized D method mathematical and physical model, experimental research was carried out on the electrostatic sensitivity of two typical nitramine explosives, Hexogen (RDX) and Octogen (HMX), at different temperatures and response probabilities, and the corresponding electrostatic discharge energy values were obtained. The results show that under different response probabilities, the electrostatic discharge energy of RDX and HMX is negatively correlated with temperature change, that is, with the increase of temperature, the electrostatic discharge energy required for detonation decreases. Among them, at 50% response probability, the corresponding electrostatic discharge energy values of RDX at three different temperatures of 30, 60 and 90 ℃ are 102.07, 97.10 and 64.14 mJ, respectively, and the corresponding electrostatic discharge energy values of HMX are 248.13, 125.62 and 84.24 mJ, respectively. At the 10-6 response probability, the corresponding electrostatic discharge energy values of RDX at different temperatures are 4.26, 2.84, and 0.89 mJ, respectively, and the corresponding electrostatic discharge energy values of HMX are 2.38, 2.09, and 0.10 mJ, respectively. It is found that the electrostatic discharge energy corresponding to the electrostatic sensitive of RDX is significantly lower than the correlation value of HMX under the same condition at a response probability of 50%, but the electrostatic discharge energy corresponding to HMX is lower than the correlation value of RDX at the three response probabilities of 1%, 0.01% and 10-6. There are significant differences in the electrostatic sensitivity of RDX and HMX explosives at different temperatures and response probabilities, the change in electrostatic characteristics should be highly concerned in assessing the safety risks of these two explosives during production.
SUN Ming-ze, WANG Yan-ping, ZENG Dan, HU Li-shuang, RAO Yun-peng, ZHANG Tian-qi, WANG Qi-hui, LUO Tai-ming.
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Science Technology and Engineering, 2026, 26(13): 5628-5636 DOI:10.12404/j.issn.1671-1815.2503171
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