基于增强轻量化YOLO的印刷电路板表面缺陷检测方法
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TP391.4

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国家自然科学基金项目(62273133)


An Enhanced Lightweight YOLO-based method for surface defect detection in printed circuit boards
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    摘要:

    针对印刷电路板(printed circuit board, PCB)表面缺陷检测任务中,现有模型难以同时兼顾检测精度、模型体积与推理速度的问题,提出了一种基于增强轻量化YOLO(enhanced lightweight YOLO, ELYOLO)的高精度PCB表面缺陷检测方法。首先根据GhostNet和解耦全连接注意力机制(decoupled fully-connected attention, DFCA),提出了GLA (ghost long-range attention)模块,在轻量化主干网络(backbone)的同时保持精度;然后,根据线性注意力机制,在主干网络末端设计了MLLA(mamba-inspired linear attention)模块,精确捕获全局上下文信息;其次,根据GSConv(grouped and shuffled convolution)和特征路径聚合,提出了一种高效颈部网络(neck),在降低计算瓶颈的同时优化了多尺度特征融合的效果。最后,采用UIoU(unified intersection over union)作为边界框回归损失函数,提升了模型的定位精度。实验结果表明,在公开PCB缺陷数据集上,相较于基线模型YOLOv11n,所提的ELYOLO模型在参数量和计算量分别降低了7.4%和17.5%,mAP50和mAP50-95分别提升了3.0和2.3个百分点,同时表现出优异的泛化能力,证明了ELYOLO可有效平衡检测精度、模型体积与推理速度。

    Abstract:

    To address the issue that existing models struggle to simultaneously balance detection accuracy, model volume, and inference speed in printed circuit board (PCB) surface defect detection tasks, a high-precision PCB surface defect detection method based on enhanced lightweight YOLO (ELYOLO) is proposed. Firstly, based on ghost network (GhostNet) and decoupled fully-connected attention (DFCA), a ghost long-range attention (GLA) module is proposed to lighten the backbone network while maintaining accuracy. Then, according to the linear attention mechanism, a Mamba-inspired linear attention (MLLA) module is designed at the end of the backbone network to accurately capture global contextual information. Secondly, based on grouped and shuffled convolution (GSConv) and feature path aggregation, an efficient neck network is proposed, which optimizes the effect of multi-scale feature fusion while reducing computational bottlenecks. Finally, unified intersection over union (UIoU) is adopted as the bounding box regression loss function to improve the localization accuracy of the model. Experimental results indicate that on the public PCB defect dataset, compared with the baseline model YOLOv11n, the number of parameters and computational cost of the proposed ELYOLO model are reduced by 7.4% and 17.5%, respectively, while mAP50 and mAP50-95 are increased by 3.0 and 2.3 percentage points, respectively. The model also demonstrates excellent generalization ability, proving that ELYOLO can effectively balance detection accuracy, model volume, and inference speed.

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王大虎,张龙斐,张鹏祥,等. 基于增强轻量化YOLO的印刷电路板表面缺陷检测方法[J]. 科学技术与工程, 2026, 26(24): 10494-10505.
Wang Dahu, Zhang Longfei, Zhang Pengxiang, et al. An Enhanced Lightweight YOLO-based method for surface defect detection in printed circuit boards[J]. Science Technology and Engineering,2026,26(24):10494-10505.

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  • 收稿日期:2025-09-15
  • 最后修改日期:2026-08-19
  • 录用日期:2026-01-22
  • 在线发布日期: 2026-09-02
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